Thank you for taking an interest in the various Semiconductor Device Set components that we offer here on ASAP Military Parts, such as those listed with NSN 5961007258354. The particular item that you have taken an interest in is listed alongside the part number 10M30ZB1, having been manufactured by Freescale Semiconductor Inc. With current availability for this product, we encourage you to utilize our online RFQ forms to quickly and easily request quotes for your comparisons. Within 15 minutes of us receiving a completed request and reviewing your provided details, a member of our staff will reach out to you to present a tailored solution.
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To make the part procurement process as simple as possible, we choose to list all offerings with as many details as we can to ensure that you find exactly what you require with ease. For example, with the NSN 5961-00-725-8354, one can determine that part number 10M30ZB1 belongs to FSC 5961 Semiconductor Devices and Associated Hardware. Furthermore, its manufacturer Freescale Semiconductor Inc specifically produced this part under CAGE Code 04713, allowing you to know the exact facility it traces back to. If you are ready to begin procurement for part number 10M30ZB1, send us a completed RFQ form today. You may also give us a call or email at any time, and we would be more than happy to assist you however we can as your strategic sourcing partner!
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-00-725-8354 Item PartTypeName: SEMICONDUCTOR DEVICE SET | 5961 | 007258354 | 0 | N | ||
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | U | |||||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| PD8354 | 2 | 1 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 1.253 INCHES NOMINAL ALL SEMICONDUCTOR DEVICE DIODE |
| ALAS | INTERNAL CONFIGURATION | JUNCTION CONTACT ALL SEMICONDUCTOR DEVICE DIODE |
| ASCQ | INTERNAL JUNCTION CONFIGURATION | PN ALL SEMICONDUCTOR DEVICE DIODE |
| AXGY | MOUNTING METHOD | THREADED STUD ALL SEMICONDUCTOR DEVICE DIODE |
| CCDG | OVERALL WIDTH ACROSS FLATS | 0.424 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.437 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
| CTQS | VOLTAGE TOLERANCE IN PERCENT | -1.0 TO 1.0 ALL SEMICONDUCTOR DEVICE DIODE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 280.00 MILLIAMPERES MAXIMUM VOLTAGE REGULATOR DIODE CURRENT ALL SEMICONDUCTOR DEVICE DIODE |
| ABBH | INCLOSURE MATERIAL | METAL ALL SEMICONDUCTOR DEVICE DIODE |
| AFZC | FUNCTION FOR WHICH DESIGNED | ZENER DIODE |
| AKPV | MOUNTING FACILITY QUANTITY | 1 ALL SEMICONDUCTOR DEVICE DIODE |
| ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | DO-4 ALL SEMICONDUCTOR DEVICE DIODE |
| ALBA | ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE | ANODE ALL SEMICONDUCTOR DEVICE DIODE |
| ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
| ASKA | COMPONENT NAME AND QUANTITY | 2 SEMICONDUCTOR DEVICE DIODE |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CQJX | NOMINAL THREAD SIZE | 0.190 INCHES ALL SEMICONDUCTOR DEVICE DIODE |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 60.0 NOMINAL NOMINAL REGULATOR VOLTAGE ALL SEMICONDUCTOR DEVICE DIODE |
| CTRD | POWER RATING PER CHARACTERISTIC | 10.0 WATTS SMALL-SIGNAL INPUT POWER,COMMON-COLLECTOR PRESET ALL SEMICONDUCTOR DEVICE DIODE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 100.0 DEG CELSIUS AMBIENT AIR ALL SEMICONDUCTOR DEVICE DIODE |
| THSD | THREAD SERIES DESIGNATOR | UNF ALL SEMICONDUCTOR DEVICE DIODE |
| TTQY | TERMINAL TYPE AND QUANTITY | 1 CASE ALL SEMICONDUCTOR DEVICE DIODE AND 1 TAB,SOLDER LUG ALL SEMICONDUCTOR DEVICE DIODE AND 1 THREADED STUD ALL SEMICONDUCTOR DEVICE DIODE |
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