Request a Quote on Integrated Device Technology Inc Part Number 0304 with the NSN 5962011980461 Today!
Thank you for taking an interest in the various Microcircuit Memory components that we offer here on ASAP Military Parts, such as those listed with NSN 5962011980461. The particular item that you have taken an interest in is listed alongside the part number 0304, having been manufactured by Integrated Device Technology Inc. With current availability for this product, we encourage you to utilize our online RFQ forms to quickly and easily request quotes for your comparisons. Within 15 minutes of us receiving a completed request and reviewing your provided details, a member of our staff will reach out to you to present a tailored solution.
To make the part procurement process as simple as possible, we choose to list all offerings with as many details as we can to ensure that you find exactly what you require with ease. For example, with the NSN 5962011980461, one can determine that part number 0304 belongs to FSC . Furthermore, its manufacturer Integrated Device Technology Inc specifically produced this part under CAGE Code , allowing you to know the exact facility it traces back to. If you are ready to begin procurement for part number 0304, send us a completed RFQ form today. You may also give us a call or email at any time, and we would be more than happy to assist you however we can as your strategic sourcing partner!
Description
Specifications
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NSN Information for Part Number 0304 with NSN 5962-01-198-0461, 5962011980461
Characteristics Data of NSN 5962-01-198-0461, 5962011980461
| MRC | Criteria | Characteristic |
|---|---|---|
| ADAQ | BODY LENGTH | 1.060 INCHES MAXIMUM |
| ADAT | BODY WIDTH | 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
| ADAU | BODY HEIGHT | 0.130 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
| AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND BURN IN AND STATIC OPERATION |
| CQSJ | INCLOSURE MATERIAL | CERAMIC |
| CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| CQZP | INPUT CIRCUIT PATTERN | 17 INPUT |
| CTFT | CASE OUTLINE SOURCE AND DESIGNATOR | D-8 MIL-M-38510 |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 120.00 MILLIAMPERES MAXIMUM SUPPLY |
| CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| CZEQ | TIME RATING PER CHACTERISTIC | 120.00 NANOSECONDS MAXIMUM DELAY |
| CZER | MEMORY DEVICE TYPE | RAM |
| TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TTQY | TERMINAL TYPE AND QUANTITY | 20 PRINTED CIRCUIT |
