Thank you for taking an interest in the various Microcircuit Memory components that we offer here on ASAP Military Parts, such as those listed with NSN 5962014490676. The particular item that you have taken an interest in is listed alongside the part number 116475, having been manufactured by Rugged Information Technology. With current availability for this product, we encourage you to utilize our online RFQ forms to quickly and easily request quotes for your comparisons. Within 15 minutes of us receiving a completed request and reviewing your provided details, a member of our staff will reach out to you to present a tailored solution.
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To make the part procurement process as simple as possible, we choose to list all offerings with as many details as we can to ensure that you find exactly what you require with ease. For example, with the NSN 5962-01-449-0676, one can determine that part number 116475 belongs to FSC 5962 Microcircuits Electronic. Furthermore, its manufacturer Rugged Information Technology specifically produced this part under CAGE Code 09BZ2, allowing you to know the exact facility it traces back to. If you are ready to begin procurement for part number 116475, send us a completed RFQ form today. You may also give us a call or email at any time, and we would be more than happy to assist you however we can as your strategic sourcing partner!
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-449-0676 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 014490676 | 0 | N | D | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| 7 | D | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 8200902JA | 5 | 1 | 5 |
| MRC | Criteria | Characteristic |
|---|---|---|
| CBBL | Features Provided | BIPOLAR AND BURN IN AND 3-STATE OUTPUT AND MONOLITHIC |
| AEHX | Maximum Power Dissipation Rating | 1.04 WATTS |
| TEST | Test Data Document | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| CQSJ | Inclosure Material | CERAMIC |
| MRC | Decoded Requirement | Clear Text Reply |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
| AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
| TTQY | Terminal Type And Quantity | 24 PRINTED CIRCUIT |
| CWSG | Terminal Surface Treatment | SOLDER |
| AGAV | End Item Identification | TERMINAL, RADIO COMMUNICATIONS SETS (MILSTAR) AN/FRC-181 (V) AND AN/ARC-208 (V) |
| CZEQ | Time Rating Per Chacteristic | 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| CZEN | Voltage Rating And Type Per Characteristic | 5.0 VOLTS NOMINAL INPUT |
| CZER | Memory Device Type | PAL |
| CQWX | Output Logic Form | TRANSISTOR-TRANSISTOR LOGIC |
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